News Releases

November 1, 2016

HDP Announces a New Project – Electro-Chemical Migration 2 (ECM)

The current industry standard test protocols were originally developed to identify highly ionic contaminant levels (halides) after a cleaning process. These test protocols are not completely effective at identifying ECM exposures from no-clean flux residues.
November 1, 2016

HDP User Group Announces Bev Christian as Its Newest Staff Member

“We are pleased to have Bev Christian join the facilitator team at HDP. He brings years of experience in Electronics Assembly and Reliability Assessment. Bev’s skills in program management and background in PWB manufacturing, assembly, and testing will be a big asset to our PWB focused project segment” said Marshall Andrews Executive Director of HDP user group.
July 12, 2016

HDP User Group Announces RBP Chemical Technology as its Newest Member

RBP Chemical Technology was founded in 1954. RBP develops, manufactures and specialty chemicals and processes used in the fabrication of printed circuit boards, semiconductors and IC substrates. Company expertise resides in surface preparation, metallization, circuit formation, HDI, solderability enhancement and processes for TSV and RDL. Further emphasis on processes to enhance signal integrity and long-term reliability.
March 21, 2016

HDP User Group Announces MacDermid Enthone Electronics Solutions as its Newest Member

MacDermid Performance Solutions is a subsidiary of Platform Specialty Products Corporation. Our companies manufacture a broad range of specialty chemicals and materials which are used in multi-step technological processes that enhance the products people use every day. Our innovative materials and processes are creating more opportunities and efficiencies for companies across key industries – including electronics, graphic arts, metal & plastic plating, and offshore oil production.
September 1, 2015

HDP User Group Announces “The Latest Findings on Tin Whiskers in Electronics”

Sponsorship of a free Webinar that will provide the latest findings on Tin Whiskers in Electronics. The NASA tin (Sn) whisker web site describes Sn whiskers as electrically conductive, crystalline structures of tin that sometimes grow from surfaces where tin (especially electroplated tin) is used as a final finish. Numerous electronic system failures have been attributed to short circuits caused by tin whiskers that bridge closely-spaced circuit elements maintained at different electrical potentials.