Name: Non-Glass Microvia Build-ups
Start: 2025-08-20T10:00:00-05:00
End: 2025-08-20T11:00:00-05:00

No events scheduled for August 17, 2025.

9:00 am

August 20 @ 9:00 am - 10:00 am

Materials #7 meeting

10:00 am

August 20 @ 10:00 am - 11:00 am

Non-Glass Microvia Build-ups

11:00 am

August 20 @ 11:00 am - 12:00 pm

Sequential Lamination

8:00 pm

August 20 @ 8:00 pm - 9:00 pm

Correlating CF Profile to Signal Integrity Project Call

8:00 am

August 21 @ 8:00 am - 9:00 am

HDP D-Coupon IST CITC Reliability Testing

9:00 am

August 21 @ 9:00 am - 10:00 am

Reflow Cycle Via Reliability Impact SMTAi Paper Review

10:00 am

August 21 @ 10:00 am - 11:00 am

ECM-4

11:00 am

August 21 @ 11:00 am - 12:00 pm

Single Surface Finish 2

2:00 pm

August 21 @ 2:30 pm - 3:30 pm

Meeting ics problem

4:00 pm

August 21 @ 4:00 pm - 5:00 pm

Glass Substrate Reliability Analysis

9:00 pm

August 21 @ 9:00 pm - 10:00 pm

Test meeting

Export Events

Final Finish Layer Deposits for High Frequency

HDP Staff Call

Materials #7 meeting

Non-Glass Microvia Build-ups

Sequential Lamination

Correlating CF Profile to Signal Integrity Project Call

HDP D-Coupon IST CITC Reliability Testing

Reflow Cycle Via Reliability Impact SMTAi Paper Review

ECM-4

Single Surface Finish 2

Meeting ics problem

Glass Substrate Reliability Analysis

Test meeting

Final Finish Layer Deposits for High Frequency

HDP Staff Call

Materials #7 meeting

Non-Glass Microvia Build-ups

Sequential Lamination

Correlating CF Profile to Signal Integrity Project Call

HDP D-Coupon IST CITC Reliability Testing

Reflow Cycle Via Reliability Impact SMTAi Paper Review

ECM-4

Single Surface Finish 2

Meeting ics problem

Glass Substrate Reliability Analysis

Test meeting

Week of Events

Sun 17

Mon 18

Tue 19

Wed 20

Thu 21

Fri 22

Sat 23

Final Finish Layer Deposits for High Frequency

HDP Staff Call

Materials #7 meeting

Non-Glass Microvia Build-ups

Sequential Lamination

Correlating CF Profile to Signal Integrity Project Call

HDP D-Coupon IST CITC Reliability Testing

Reflow Cycle Via Reliability Impact SMTAi Paper Review

ECM-4

Single Surface Finish 2

Meeting ics problem

Glass Substrate Reliability Analysis

Test meeting