Name: High Freq.Meas. 3
Start: 2017-08-29T10:00:00-05:00
End: 2017-08-29T11:00:00-05:00

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High Freq.Meas. 3

August 29, 2017 @ 10:00 am - 11:00 am CDT

« PTH Creep Fatigue Under Roughness Influence Project Meeting
RF Failure Detection »

The mission of HDP User Group International Inc., is to drive innovations in the Electronics Industry reducing cost and time to market through active collaborations that solve critical and emerging problems for the benefit of the membership

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